PANalytical’s Empyrean multi-purpose diffractometer
supports many X-ray techniques used for the analysis of powdered and solid substances, nanomaterials, whether for thin films, slurries and suspensions. Empyrean can also perform preferred orientation (texture) and residual stress analysis using the chi-tilt method. When working with large and heavy samples, the 3-axes Empyrean cradle enables analysis of components weighing up to 2 kg. Parallel-beam geometry can be used for the phase identification of rough or irregularly shaped objects as well as for thin films characterization.
The instrument equipped with two position sensitive detectors: X’Celerator 1D and PIXcel-3D for high speed data collection.
High temperature attachment : HTNK 1200K allows study of temperature dependences of structure in the range from RT up to 1200oC.
The switching between application setups can be realized in a fast and cost-effective way using PreFIX concept, with no system realignment, and no compromise on the quality of diffraction data.
Huber G670 camera: The fast analysis of powder and liquid materials can be carried out also in transmission mode by using Huber G670 camera offers a modern image plate detection method in the Guinier geometry. This compact Guinier powder diffractometer unites the high resolution of the old analog wet film method with the high sensitivity of image plate detection technology. Thus it is capable of providing digital powder diffractograms within the shortest possible time. It has also a hot stage capillary module for high temperature measurements up to 900oC.
The rocking curves of single crystal samples, superlattices structures and nearly perfect mono- and multi-layered thin films can be measured in double crystal geometry by means a Bede D3 high-precision goniometer combined with an 18 kW Rigaku rotating anode generator.