Spectroscopic Ellipsometer Sentech SE800 (Room 004)

The Sentech SE800 Spectroscopic Ellipsometer is using a Xe-white light source and a diffraction grating with an array of photodiodes to capture data for many wavelengths simultaneously. It can measure at multiple angles of incidence, and is equpied with a mapping sample stage and optional microspot optics.

Measurements are made in air under ambient conditions.