The Sentech SE800 Spectroscopic Ellipsometer is using a Xe-white light source and a diffraction grating with an array of photodiodes to capture data for many wavelengths simultaneously. It can measure at multiple angles of incidence, and is equpied with a mapping sample stage and optional microspot optics.
Measurements are made in air under ambient conditions.
Wavelength range: 280 nm to 850 nm
Wavelength resolution: ~ 1 nm
Angle of incidence: ~ 55 deg to ~ 70 deg
Building 51 , Room 004
Tel : 972-8-6428657
Fax : 972-8-6428638
Building 51 , Room 109
Tel : 972-8-6477798
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