The Helios G4 UC is a fully digital, Extreme High Resolution (XHR) Field
Emission Scanning Electron Microscope (FE SEM) equipped with Focused Ion Beam
(FIB) technology. It allows for the fast characterization of nanometer details
and analysis in 2D and 3D, best in class sample preparation and flexible
nanoprototyping. In combination with the most comprehensive software and
application expertise, it allows for the fastest preparation of HR-S/TEM
samples for a wide range of materials.The Dual Beam FIB system employs a
focused ion beam for site-specific material removal, with an electron beam then
providing non-destructive imaging of the exposed sub-surface features.
Applications are in both life science and materials science, and include
preparation of TEM samples, serial sectioning of tissue for structural studies
and 3D tomography of nanostructures and nano-devices.