Ilse Katz Institute for Nanoscale Science & Technology - JEOL JEM2011 Transmission Electron Microscope

Overview

The JEOL JEM-2011 is a transmission electron microscope (TEM) with a LaB₆ filament. The TEM is equipped with an energy dispersive spectroscopy (EDS) x-ray detector and a scanning transmission electron microscope attachment. This combination allows for comprehensive elemental and micro-structural analysis at high magnifications and a wide range of capabilities:

Bright-field and dark field imaging.
High-resolution imaging.
Selected-area electron diffraction (SAED), nano-beam and convergent-beam electron diffraction.
Micro-area elemental analysis and mapping.

Specification

JEOL JEM 2011 Specifications

Accelerating voltage: 200 kV

Point resolution – 0.19 nm

Lattice image resolution – 0.14 nm

Objective lens:

Focal length – 1.9 mm
Spherical aberration – 0.5 mm
Chromatic aberration – 1.1 mm
Min. focal step 1.0 mm

Magnification:

MAG mode: × 2,000-1,500,000
LOW MAG mode: × 50-6,000
SA MAG mode: × 8,000 – 800,000

SA DIFF camera length: 80-2,000 mm

Specimen tilting angle: ±20°

EDS: Resolution 134 eV, 30 mm² crystal.

Camera: Gatan UltraScan 1000 with 2k X 2k High resolution camera.

Applications

Contact Person

JEOL JEM 2011 contact person

Dr. Vladimir (Volodia) Ezesky

Ilse Katz Institute for Nanoscale Science and Technology

Ben-Gurion University of the Negev

http://web.bgu.ac.il/Eng/Centers/nano

Tel 972-8-6428629

Fax 972-8-6428638

Beer-Sheva 84105, Israel

ezesky@bgu.ac.il

Dr. Alexander Upcher

Ilse Katz Institute for Nanoscale Science and Technology

Ben-Gurion University of the Negev

http://web.bgu.ac.il/Eng/Centers/nano

Tel: 972-8-6479510/1

Fax: 972-8-6428638

Beer-Sheva 84105, Israel

upcher@bgu.ac.il